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G06200 - SEMI G62 - 銀めっきの試験方法 StdTpc-Equipment - Facilities Interface SEMI M20-92 (technical revision)
G06200 - SEMI G62 - 銀めっきの試験方法 StdTpc-Equipment - Facilities Interface SEMI M20-92 (technical revision)
$115.50
Description
SEMI M20-92 (technical revision)
This Test Method covers the measurement of generation lifetime and generation velocity of silicon wafers
Floating Zone (FZ) method for single crystal silicon wafers
through the oxide layers
G06200 - SEMI G62 - 銀めっきの試験方法 StdTpc-Equipment - Facilities Interface SEMI M20-92 (technical revision)global Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org199520023 : Referenced SEMI Standards SEMI G55 Test Method for Measurement of Silver Plating Brightness SEMI G56 Test Method for Measurement of Silver Plating Thickness
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