G04200 - SEMI G42 - 半導体パッケージのジャンクション部と周囲間の熱抵抗測定用標準熱抵抗測定基板の仕様 StdPbc-1114 There are two main purposes

There are two main purposes of this Standard:

11-0698 (first published)

5  This Test Method requires the use of three different kinds of particle distributions with specified characteristics and wafers that have surface characteristics adequate to allow detection of the smallest particles utilized with a capture rate of greater than 95%

SEMI G86-0303 (Reapproved 0811)

G04200 - SEMI G42 - 半導体パッケージのジャンクション部と周囲間の熱抵抗測定用標準熱抵抗測定基板の仕様 StdPbc-1114 There are two main purposesglobal Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org1986200411 : Referenced SEMI Standards SEMI G32 Guideline for Unencapsulated Thermal Test Chip SEMI G38 Test Method for Still and Forced Air Junction to Ambient Thermal Resistance Measurements of Integrated Circuit Packages