G08400 - SEMI G84 - Specification for Strip Map Protocol StdPbc-0220 while maintaining wafer quality

while maintaining wafer quality

This guide does not include requirements for individual exhausted enclosures (e

This Standard specifies markers on FPD polarizing films

Figure 1 shows the scope of the standardized interface

G08400 - SEMI G84 - Specification for Strip Map Protocol StdPbc-0220 while maintaining wafer qualityThe purpose of this specification is to provide definition that will enable the implementation of strip mapping throughout the assembly and test process. This document will enable standardization of the strip map format and execution method throughout the factory floor. This document describes the format and methods in which strip map information shall be formatted and used to transfer information about a strip to and from equipment using the SECS GEM