Home
»
»
G02300 - SEMI G23 - Test Method of Inductance for Internal Traces of Semiconductor Packages StdPbc-0118 SEMI 3D7-0913 (first published)
G02300 - SEMI G23 - Test Method of Inductance for Internal Traces of Semiconductor Packages StdPbc-0118 SEMI 3D7-0913 (first published)
$193.00
Description
SEMI 3D7-0913 (first published)
This Guide supports the approach by off-line measurement of the contaminants using best available techniques available in the laboratory setting
transport and storage system controller architecture
SEMI MF1763-0706 (technical revision)
G02300 - SEMI G23 - Test Method of Inductance for Internal Traces of Semiconductor Packages StdPbc-0118 SEMI 3D7-0913 (first published)This Test Method describes the measurement method for the inductance of internal traces of semiconductor packages. This Test Method is applicable for the measurement of package inductance that is greater than 0. 5 nH. This Test Method describes the measurement of a pin grid array, one of the package types, as a sample. This Test Method is also applicable to other types of packages. The inductance in this Standard is limited to that of internal traces
Shipping Notes
- Free Standard Shipping on $100+ Orders to the USA.
- Except Preorder products are shipped in 48 hours.
- Delivery to the USA:
- Standard Shipping : 3-10 business days
- If time is of the essence, please consider selecting expedited delivery for faster service.
){kind=link}