MS00900 - SEMI MS9 - Specification for High Density Permanent Connections Between Microfluidic Devices Revision:SEMI MS9-0611 - Inactive 34-1109 (technical revision)

34-1109 (technical revision)

there are few or no agreed upon test methods for measuring the physical and dimensional properties of through glass vias or other openings in glass or the pattern or structures

and package engineers

which are intended to provide wafers avoiding the difficulties enumerated above

MS00900 - SEMI MS9 - Specification for High Density Permanent Connections Between Microfluidic Devices Revision:SEMI MS9-0611 - Inactive 34-1109 (technical revision)This Standard was technically approved by the global MEMS NEMS Committee. This edition was approved for publication by the global Audits & Reviews Subcommittee on May 13, 2011. Available at www. semiviews. org and www. semi. org in June 2011. This Standard provides specification for interconnection dimensions and performance requirements for permanent microfluidic interfaces. It also provides guidance for interface design. This will help to enable low