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G00300 - SEMI G3 - 仕様 側面ろう付け積層板 Revision:SEMI G3-90 - Inactive This edition was approved for

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This edition was approved for publication by the global Audits and Reviews Subcommittee on May 19

and with scanning electron microscopy with energy dispersive x-ray spectrometry (SEM/EDX) to identify the elemental composition of the particles

Water absorption (see SEMI G75

SEMI MF1723 –– Practice for Evaluation of Polycrystalline Silicon Rods by Float-zone Crystal Growth and Spectroscopy

G00300 - SEMI G3 - 仕様 側面ろう付け積層板 Revision:SEMI G3-90 - Inactive This edition was approved forCurrentInactiveInactiveSEMI 7. 62 mm (0. 003 in.)10. 16 mm (0. 400 in.)15. 24 mm (0. 600 in.)22. 86 mm (0. 900 in.) Referenced SEMI Standards None.

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