Optics and optical instruments. Veiling glare of image forming systems. Definitions and methods of measurement Ingestion-build-86103 PD IEC TR 62878‑2‑7 on

PD IEC TR 62878‑2‑7 on guidelines for accelerated stress testing of passive embedded circuit boards is relevant to:

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Optics and optical instruments. Veiling glare of image forming systems. Definitions and methods of measurement Ingestion-build-86103 PD IEC TR 62878‑2‑7 on1 Scope This International Standard adopts both the veiling glare index (VGI) and the glare spread function (GSF) as measures of the veiling glare characteristics of optical and electrooptical imaging systems. Laboratory measurement techniques are described in general terms and recommendations are made regarding the performance of the main subunits of the equipment. The measurement techniques described in this International Standard are chiefly valid