Semiconductor devices. Mechanical and climatic test methods - Neutron irradiation Ingestion-build-135476 – Event reporting and logging

– Event reporting and logging

This document is not intended for the purpose of taking a decision whether an incident is reportable or not

the following technical changes have been made:

measurements being made on one of more points on the steeply rising part of the stress-strain curve

Semiconductor devices. Mechanical and climatic test methods - Neutron irradiation Ingestion-build-135476 – Event reporting and loggingWhat is this standard about? The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military and aerospace related applications. It is a destructive test. The objectives of the test are as follows: a) to detect and measure the degradation of