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Semiconductor devices. Micro-electromechanical devices - Tensile testing method of thin film materials has-digital It covers classification according to

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It covers classification according to wear and appearance retention

— standard test severity classes

Interface 9-1- Plug connector interface

This International Standard provides terms and definitions used in the production

Semiconductor devices. Micro-electromechanical devices - Tensile testing method of thin film materials has-digital It covers classification according to

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